✦ LIBER ✦
1134. Arrangement for checking of thichness of films, deposited by vacuum evaporation, by means of the reflection coefficient: V N Rozhdestvenkiy and A G Fleysher, optiko-mekh prom, no 12, 1970, 31–32 (in Russian).
- Publisher
- Elsevier Science
- Year
- 1971
- Tongue
- English
- Weight
- 130 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0042-207X
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