✦ LIBER ✦
1105. Scanning electron microscope investigation of ion etching of metals at oblique ion incidence: W Hauffe, Exper Tech Phys, 19 (5), 1971, 407–411 (in German)
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 145 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0042-207X
No coin nor oath required. For personal study only.