10th International Conference on Metrology & Properties of Engineering Surfaces
β Scribed by H. Zahouani; B.-G. Rosen; T.R. Thomas
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 54 KB
- Volume
- 264
- Category
- Article
- ISSN
- 0043-1648
No coin nor oath required. For personal study only.
β¦ Synopsis
This was the tenth in the very successful series of conferences which have firmly established surface topography as a new and exciting interdisciplinary field of scientific and technological studies. Recent advances in measurement techniques have extended the scope of roughness measurements to much smaller scales and many new results are reported. For the first time the conference was held in France, and was organized by the Ecole Nationale d'Ingénieurs de Saint-Etienne (ENISE), the Ecole Nationale Supérieure des Mines de Saint-Etienne (ENSMSE) and the Laboratoire de Tribologie et Dynamique des Systèmes (LTDS) of the Ecole Centrale de Lyon. It took place at the ENSMSE at St. Etienne in France on 4-7 July 2005.
The aims of the conference were to bring together practising engineers and research workers in a forum where the latest work can be reported, discussed and assimilated so that its benefits may be transferred to industry and to scientists and engineers in other disciplines. The scope of the conference was the measurement, characterization and analysis of surface roughness on any scale, comprising experimental, theoretical and computational work. Conference subjects included bioengineering, nano surfaces, 3D instrumentation, mathematical morphology, waviness and painting signature, roughness and touching, contact mechanics, tribology, optical surfaces, wear and archaeology.
Since the Conference was held, news has reached us of the death of Professor K.J. Stout. Professor Stout was co-founder of this series of conferences in 1979 and has played a major part in organizing subsequent conferences, hosting many at his own institutions. His contributions to the subject of surface roughness are immense and he will be greatly missed by his many friends and colleagues. This brief tribute is not intended as more than a * Corresponding author.
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