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1-D model of current distribution and resistance changes for electromigration in layered lines

✍ Scribed by Grosjean, D.E.; Okabayashi, H.

Book ID: 114536782
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 176 KB
Volume: 44
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.568035

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