✦ LIBER ✦
072011 (M10, B33) Two-stage reliability tests with technological evolution: a Bayesian analysis : Whitmore G.A., Young K.D.S., Kimber A.C., McGill University, Montreal, Canada, University of Surreym Guildford, United Kingdom, Journal of the Royal Statistical: Applied Statistics, Vol. 43, nr. 2, 1994, pp. 295–307
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 114 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0167-6687
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