0.13-μm 32-Mb/64-Mb embedded DRAM core with high efficient redundancy and enhanced testability

✍ Scribed by Kikukawa, H.; Tomishima, S.; Tsuji, T.; Kawasaki, T.; Sakamoto, S.; Ishikawa, M.; Abe, W.; Tanizaki, H.; Kato, H.; Uchikoba, T.; Inokuchi, T.; Senoh, M.; Fukushima, Y.; Nirro, M.; Maruta, M.; Shibayama, A.; Ooishi, T.; Takahashi, K.; Hidaka, H.

• Book ID: 119798928
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 390 KB
• Volume: 37
• Category: Article
• ISSN: 0018-9200
• DOI: 10.1109/jssc.2002.1015693